DEVELOPMENT OF A METHOD FOR CALIBRATION OF A SEMICONDUCTOR TEMPERATURE MEASUREMENT SENSOR

Authors

  • Tsanko Karadzhov Department of Machine and Precision Engineering, Technical University of Gabrovo, Center of competence "Smart mechatronic, eco-and energy-saving systems and technologies", Gabrovo, Bulgaria
  • Iliyan Gospodinov Department of Machine and Precision Engineering, Technical University of Gabrovo, Gabrovo, Bulgaria
  • Dimitar Dichev Department of Machine and Precision Engineering, Technical University of Gabrovo, Center of competence "Smart mechatronic, eco-and energy-saving systems and technologies", Gabrovo, Bulgaria
  • Iliya Zhelezarov Department of Machine and Precision Engineering, Technical University of Gabrovo, National Center of Excellence Mechatronics and Clean Technologies, Gabrovo, Bulgaria

DOI:

https://doi.org/10.68302/std2026.vol2.206

Keywords:

Semiconductor thermistor, Nominal resistance, Steinhart–Hart, Temperature measurement

Abstract

Temperature is one of the most commonly measured quantities in science and industry. Temperature can have a significant impact on the course of various processes therefore, its accurate measurement and control is a task of particular importance for every process in everyday life, science, and industry. Precise temperature measurement is used in all fields - electronics, communications, mechanical engineering and medicine, and determines the quality of the manufactured product. In this study, an experimental calibration was performed on a semiconductor thermistor with a nominal resistance of 10 kΩ in the temperature range from 0°C to 90°C. Based on the experimental data obtained, the coefficients of the Steinhart–Hart equation were determined, which allow for a more precision determination of the temperature from the measured resistance of the sensor.

Supporting Agencies

The authors acknowledge the support of the European Regional Development Fund, within the Operational Programme “Research, Innovation and Digitalization Programme for Intelligent Transformation 2021–2027”, through Project No. BG16RFPR002-1.014-0006 for the experimental investigations and measurement equipment, and through Project No. BG16RFPR002-1.014-0005 for the theoretical development and analytical framework of the study.

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Published

17.09.2026

Issue

Vol. 2 (2026): Proceedings of the International Conference on Secure Systems Design and Technology Development.

Section

LASER TECHNOLOGY

License

Copyright (c) 2026 Tsanko Karadzhov, Iliyan Gospodinov, Dimitar Dichev, Iliya Zhelezarov

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

How to Cite

[1]
T. Karadzhov, I. Gospodinov, D. Dichev, and I. Zhelezarov, “DEVELOPMENT OF A METHOD FOR CALIBRATION OF A SEMICONDUCTOR TEMPERATURE MEASUREMENT SENSOR”, SysTechDev, vol. 2, pp. 449–455, Sep. 2026, doi: 10.68302/std2026.vol2.206.